Revista Mexicana de Astronomía y Astrofísica

PDF
PDF

Keywords

instrumentation: detectors
methods: observational
techniques: image processing
telescopes
Astrophysics - Instrumentation and Methods for Astrophysics
Physics - Instrumentation and Detectors

How to Cite

Calibration of 122 SensL MicroFJ-60035 SiPMs and the Reduction of Optical Cross-Talk due to Coupled Light Guides. (2023). Revista Mexicana De Astronomía Y Astrofísica, 59(2), 379-388. https://doi.org/10.22201/ia.01851101p.2023.59.02.14

Abstract

Recent silicon photomultipliers (SiPMs) boast excellent production quality, eliminating the need for individual breakdown voltage calibration. We present measurements of cross-talk probability and relative gain for 122 SensL MicroFJ-60035-TSV SiPMs. These semiconductor photosensors have replaced photomultiplier tubes in many applications due to their single-photon resolution, insensitivity to magnetic fields, robustness, and cost-effective photon detection at lower voltages. Light guides expand SiPMs' small photosensitive area, and optical coupling reduces cross-talk probability compared to bare sensors at nominal bias voltage, as demonstrated in this study.

Resumen

Los fotomultiplicadores de silicio (SiPMs) de generaciones recientes tienen una alta calidad de producción, lo que elimina la necesidad de calibrar individual- mente el voltaje de caída. En este estudio, se midió la probabilidad de interferencia y la ganancia relativa de 122 SiPMs SensL MicroFJ-60035-TSV. Estos dispositivos semiconductores reemplazan a los tubos fotomultiplicadores en diversas aplicaciones debido a su capacidad para detectar un solo fotoelectrón, su insensibilidad a cam- pos magnéticos, su robustez, y su mejora en la eficiencia de detección de fotones con menor voltaje y costos. Para aumentar elárea fotosensible de los SiPMs se utilizan guías de luz. Al comparar sensores acopladosópticamente a guías de luz con sensores aislados a voltaje base, se observa que el acoplamientoóptico reduce significativamente la interferencia en los sensores estudiados.

Aharonian, F., An, Q., Axikegu, B. L., et al. 2021, EPJC, 81, 657, https://doi.org/10.1140/epjc/s10052-021-09414-z
Anderhub, H., Backes, M., Biland, A., et al. 2013, JInst, 8, 6008, https://doi.org/10.1088/1748-0221/8/06/P06008
Audehm, J., Serna, J., Alfaro, R., et al. 2019, ICRC 36, 636, https://doi.org/10.22323/1.358.0636
Beadie, G., Brindza, M., Flynn, R. A., Rosenberg, A., & Shirk, J. S. 2015, ApOpt, 54, 139, https://doi.org/10.1364/AO.54.00F139
Beck, M., Arbet-Engels, A., Baack, D., et al. 2019, ICR, 36, 630, https://doi.org/10.22323/1.358.0630
Biland, A., Bretz, T., Buß, J., et al. 2014, JInst, 9, 0012, https://doi.org/10.1088/1748-0221/9/10/P10012
Bretz, T., Hebbeker, T., Kemp, J., et al. 2018, JInst, 13, 7024, https://doi.org/10.1088/1748-0221/13/07/P07024
Bretz, T. & Ribordy, M. 2013, Aph, 45, 44, https://doi.org/10.1016/j.astropartphys.2013.03.004
Dorner, D., Arbet-Engels, A., Baack, D., et al. 2019, ICRC, 36, 665, https://doi.org/10.22323/1.358.0665
Engelmann, E., Popova, E., & Vinogradov, S. 2018, EPJC, 78, 971, https://doi.org/10.1140/epjc/s10052-018-6454-0
Futlik, L. L., Levin, E. V., Vinogradov, S. L., et al. 2011, BLPI, 38, 302, https://doi.org/10.3103/S1068335611100058
Huber, B., Braun, I., Anderhub, H., et al. 2011, ICRC, 9, 2, https://doi.org/10.7529/ICRC2011/V09/0136
Klanner, R. 2019, NIMPA, 926, 36, https://doi.org/10.1016/j.nima.2018.11.083
Knoetig, M. L., Biland, A., Bretz, T., et al. 2013, https://arxiv.org/abs/1307.6116, https://doi.org/10.48550/arXiv.1307.6116
Koschinsky, J. P., Audehm, J., Auffenberg, J., et al. 2017, Verhandlungen der Deutschen Physikalischen Gesellschaft, (Muester2017issue), 1
ON Semiconductor, Data sheet J-Series SiPM Sensors, Datasheet Rev. 6, 2018, Accessed: 2020-02-10
Pagano, R., Corso, D., Lombardo, S., et al. 2012, IEEE Transactions on electron devices, 59, 2410, https://doi.org/10.1109/TED.2012.2205689
Rech, I., Ingargiola, A., Spinelli, R., et al. 2008, OExpr, 16, 8381, https://doi.org/10.1364/OE.16.008381
Rysewyk, D., Lennarz, D., DeYoung, T., et al. 2020, APh, 117, 102417, https://doi.org/10.1016/j.astropartphys.2019.102417
Schaufel, M., Bretz, T., Schumacher, J., et al. 2017, ICRC, 35, 786, https://doi.org/10.22323/1.301.0786
Springer, R. W. & HAWC Collaboration. 2016, NPPP 279, 87, https://doi.org/10.1016/j.nuclphysbps.2016.10.013
Sun, Y. & Maricic, J. 2016, JInst, 11, 1087, https://doi.org/10.1088/1748-0221/11/01/C01078
Tajima, H. Private Communication, 2020
Winston, R., Minano, J. C., & Benitez, P. G. 2005, Nonimaging Optics, Academic Press